基本情報
Last Update:2023/03/23
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Original license (see manual)
| 利用環境 | Mac and Windows (binaries) |
|---|---|
| 関連キーワード |
RIETAN-FP
An application for the Rietveld analysis used in X-ray and neutron diffraction experiments. This application determines lattice constants and atomic coordinates from X-ray and neutron diffraction data on powder samples by pattern fitting based on the maximum entropy method (MEM). It can also analyze materials with random atomic configuration effectively. It supports Windows and Mac OS, and is still being developed actively.